化妆品包装容器及配件产品常见缺陷分类描述
ITEM
DEFECT DESCRIPTION
中文描述
Glass Container
玻璃容器
weight or OFC out of spec.
重量，容量超标
broken ware
容器破裂
split finish
瓶口裂纹
chipped finish
瓶表面有凹口
check
瓶身及瓶颈的裂纹
bent neck
瓶颈倾斜
white sports on inner surface
瓶的内表面附有白色斑点
wrong decoration
装饰错误
dirty
肮脏
Plastic Container
塑料容器
weight or OFC. out of spec
重量，容量超标
uneven rim at mouth area
瓶口不平整
flow traces in mouth dirty)
瓶颈有污水流痕
excess flash
溢料
poor printing
精劣的印刷
chocked neck
颈部溢料以致颈部内径变小
over ride
滑牙
foreign material in plastic
材质中含杂质
dust,soot,dirt on container
灰尘，烟灰，脏物污染容器
out-of-shape ware
容器变形
light (thin) ware
瓶壁过簿
Cap / Cover
瓶帽 / 盖
dimension out of spec.
尺寸超标
dose not fit and seal container
与容器的配合不当，密封不好
missing or loosing liner
垫片松脱
垫片弯曲，有缺口
excess glue
溢胶水
excess flash
溢料
broken
scratched or scuffed
有刮痕或磨损
foreign spots in material
材质中含杂质
loose metal ring
瓶上的金属环松
Tube
塑料软管
functional dimensions out of spec.
功能尺寸超标
clogged orifice
管口堵塞
stuck together damage appearance
管与管粘在一起，有印刷留痕
excess flash
溢料
warpped
管子弯曲变形
coating peel of
光油层脱落
over ride
滑牙
Barrel
口红壳及唇膏筒
dimensions out of spec.
尺寸超标
missing component part.
部件遗失
loose, tight or incorrect assembly of component parts
部件配合不当，过松或过紧
color outside limits
颜色超标
over ride
滑牙
dirty
肮脏
Compact
化妆盒
loose or tight closure, or incorrect assembly of component parts
部件配合不当，过松或过紧
top and bottom halves of compacts not meeting properly
盖与底配合部位不当
broken,bent,cracked,or distorted hinges or catches
折合叶的铰链或接合处破裂，弯曲，破裂及变形
塑料盘或板
塑料圆筒
密封垫
MIL-STD-105 抽样方案
MIL-STD-105 Sampling Scheme
Sampling plans are usually selected for given quality levels such as AQL, a, LQL, and b. The selected plan will have to be repeatedly used for each of the submitted lots if the quality levels remain unchanged. If the quality history is good, as evidenced by consecutive lot acceptances, then it may be desirable to reduce the amount of inspection. If the quality history is found to be bad (more lot rejections), then it is essential to tighten the inspection either by increasing the sample size or reducing the acceptance numbers. A specific plan selected for given quality levels has no mechanism to adjust according to the observed quality history. In such situations, the use of more than one plan is desirable with an associated rule for using each plan.
An acceptance sampling scheme is a specific set of procedures which usually consists of acceptance sampling plans in which lot sizes, sample sizes, and acceptance criteria, or the amount of 100% inspection, are related. Such schemes typically contain rules for switching from one plan to another. MIL-STD-105 E (1989) is an example for a sampling scheme.
A normal inspection plan is the plan used when the process is considered to be operating at, or slightly better than, the AQL.
A tightened inspection plan is a plan for using stricter acceptance criteria than those used in normal inspection.
A reduced inspection plan is a plan which permits smaller sample sizes than those used in normal inspection.
The main
objective of using tightened inspection is to exert pressure on the producer
when the quality is poorer than the AQL by introducing a higher rate of
rejection. When the level of the submitted quality is sufficiently good,
reduced inspection offers sampling economy. For example, consider the
following single sampling plans having three different inspection
intensities.
Normal: n =
125, Ac = 1, Re = 2
Tightened: n = 200, Ac = 1, Re = 2
Reduced: n = 50, Ac = 0, Re = 1
These plans can be operated in a sampling scheme provided that there are rules for switching between them.
MIL-STD-105 E (1989) is an AQL indexed standard. Here, the AQL is defined as the percent defective (or the maximum number of defects per 100 units) that for the purposes of sampling inspection, is considered satisfactory as a process average. MIL-STD-105 E contains three inspection intensities namely, normal, reduced and tightened plans. Single, double and multiple sampling plans are available, and plans of same inspection level are matched. This means that one may use single, double or multiple sampling plans depending on the sampling economy or reduction in complexity required, giving the same level of protection to the producer or consumer. In order to implement the switching rules, a table of limit numbers for reduced inspection is also available. The scheme also contains supplementary tables and graphs of limiting quality values, OC curves, ASN curves for double and multiple sampling plans which are not contained in this Study Guide. The essential tables are
Lot size - sample size code letters.
Master tables for single sampling - normal, reduced and tightened (3 tables).
Master tables for double sampling - normal, reduced and tightened (3 tables).
Master tables for 7-stage multiple sampling - normal, reduced and tightened (3 tables).
Limit numbers for reduced inspection.
For reduced plans (the final stage ones for double and multiple plans), Re does not equal Ac+1. A result between Ac and Re signals a switch to normal inspection. For example, consider the reduced inspection single sampling plan for Code K, AQL=1%, namely n = 50, Ac = 1 and Re = 4. While on reduced inspection, if two defectives are found the lot will be accepted but a switch to normal inspection will take place.
The following steps are recommended for obtaining a sampling scheme from MIL-STD-105 E tables. Decide on the AQL.
1) Decide on the type of sampling plan (single or double or 7-stage multiple).
2)Decide on lot size.
3)Obtain the sample size code letter for Level II of General Inspection Level (or any other designated level) for given lot size.
4)Refer to the appropriate master tables to obtain the required normal, tightened and reduced plans using the AQL and the sample size code letter found in Step 4.
5)Obtain the limit numbers for reduced inspection using the AQL and the number of sample units for the last 10 lots.
6)Use Appendix A4.4 to get the switching rules.
7)Obtain the other relevant performance measures such as LQ, ASN, AOQ and ATI curves (not available in the Study Guide)
Example:
To obtain the MIL-STD-105 E scheme for the desired AQL of 0.65% and lot size 2000, one proceeds as follows:
Step 1: AQL = 0.65.
Step 2: single sampling.
Step 3: lot size = 2000.
Step 4: sample size code letter = K.
Step 5: Master tables yield:
normal
inspection plan n = 125 Ac = 2 Re = 3.
tightened inspection plan n = 125 Ac = 1 Re = 2.
reduced inspection plan n = 50 Ac = 1 Re = 3.
Step 6: Limit number for reduced inspection = 4 for AQL = 0.65 and the number of sample units for 10 lots = 1250.
Steps 7 & 8: Consult MIL-STD-105 E or ANSI/ASQC Z1.4 standard tables.
The scheme starts with normal inspection for the first lot and the switching rules shall apply from then on. If one fails to apply the switching rules and uses only normal plans, protection to the consumer will be lost. Consulting supplementary tables and graphs of the standard may also be necessary in order to have some idea of the ASN, AOQL etc.
MIL-STD-105 E contains OC curves for individual sampling plans only. The OC curve of the scheme, ie the steady state or composite OC curve after implementing the switching rules, is not available in the standard.
The civilian version of the MIL-STD-105 E is the international standard: ISO 2859:1985-91 (also BS (British Standards Institution): 6001:1989-91), Sampling Procedures for Inspection by Attributes which corresponds to MIL-STD-105 E. The ISO standard 2859:1985-91 includes the composite OC curves and modifies the rule for discontinuation of inspection to '5 lots not being accepted while on tightened inspection'.
| Lot or Batch Size | Special Inspection Levels | General Inspection Levels | |||||
|---|---|---|---|---|---|---|---|
| S-1 | S-2 | S-3 | S-4 | I | II | III | |
| 2 to 8 | A | A | A | A | A | A | B |
| 9 to 15 | A | A | A | A | A | B | C |
| 16 to 25 | A | A | B | B | B | C | D |
| 26 to 50 | A | B | B | C | C | D | E |
| 51 to 90 | B | B | C | C | C | E | F |
| 91 to 150 | B | B | C | D | D | F | G |
| 151 to 280 | B | C | D | E | E | G | H |
| 281 to 500 | B | C | D | E | F | H | J |
| 501 to 1200 | C | C | E | F | G | J | K |
| 1201 to 3200 | C | D | E | G | H | K | L |
| 3201 to 10000 | C | D | F | G | J | L | M |
| 10001 to 35000 | C | D | F | H | K | M | N |
| 35001 to 150000 | D | E | G | J | L | N | P |
| 150001 to 500000 | D | E | G | J | M | P | Q |
| 500000 and over | D | E | H | K | N | Q | R |
TABLE FOR SAMPLES SIZES, MIL-STD-105D
SINGLE SAMPLING PLANS FOR NORMAL INSPECTION (TABLE IIA OF MIL-STD-105D)
SINGLE SAMPLING PLANS FOR TIGHTENED INSPECTION (TABLE IIB OF MIL-STD-105D)
SINGLE SAMPLING PLANS FOR REDUCED INSPECTION (TABLE IIC OF MIL-STD-105D)
